Our ATG, developed by TPS developers for TPS developers, is unique without an equal in the industry. Not merely a TRD documentation tool but a fault analysis, test development and Fault Detection/Isolation scoring system.
Over 20 years ago, the only fault-centered concept that existed was the LOGOS/HITS/LASAR simulation for digital and card level devices. Our fault
We developed the ATG with the same results with an advantage; it can be used for analog, digital, hybrid and box level applications.